Device research laboratory 1
Solar cell I-V measurement system
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Thermal evaporation system 1
Integrating sphere system with spectrometer
Constant temperature & humidity chamber
Fluorescence lifetime spectrometer & cryo set
Dark box
Luminance & color meter
Spectrorariometer
Thermal evaporation system 2
Lifetime measurement system 1
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Device research laboratory 2, 3
Ellipsometer
Glove box & spin coater
Gaussian 16
Schrodinger
super computer
Alpha step stylus profiler
Accelrys Material studio 8.0
workstation
Lifetime measurement system 1
Spectrofluorometer
(PL measuring system)
UV-visible spectrophotometer
Cyclic voltammetry
Atomic layer deposition (ALD)
Synthesis research laboratory
Manufacturer
Sunic (Sunicel 120 plus)
Specification
- Evaporaion chamber 1, Buffer
chamber 1 (load / unload)
- Vacuum condition : < 5.0E-7 Torr
- Organic source cell : 10 ea
- Metal source cell : 4 ea
- 2 masks (for organic, for metal)
- With globe box for encapsulation
Manufacturer
Selcos (CETUS OL 150)
Specification
- Evaporaion chamber 2, Loadlock
chamber 1 (load / unload)
- Vacuum condition : < 5.0E-7 Torr
- Organic source cell : 10 ea
- Metal source cell : 4 ea
- 2 masks (for organic, for metal)
- Sub-shutter system
- Aligner rotating system
- With gloce box for encapsulation
Manufacturer
Inexus.inc (Spin coater ACE-200)
Specification
- Wafer size(Max.) : piece to 4" diameter, 6“
- Bowl size : 235 m/m Bowl
- Bowl material : SUS
- Special DC Motor : Up & Down free
- Step : 100 step
- Rotation Speed : 0 to 50 ~ 8,000 rpm
- Hold Time : 1~999sec
- Accuracy : ± 1 R.P.M
- Acceleration, deceleration free :
3,000 R.P.M/sec
- Power Input : AC 220V, 50/60Hz
- Vacuum Input
-450 ~ -650mmHg (6mm ID / 8mm OD)
- Dimension : 320 × 420 × 220 mm
Manufacturer
ENC technology
Specification
- Equipped with spectrometer source
measurement unit and computer
- Containing 2 measurement kits
· Glass substrate size
(25 × 25 mm², 50 × 50 mm²)
· Bottom & top emission device
- During measurement, can be
observed through CCD camera
- Measurement items
· I-V, J-V, L-cd/A, L-lm/W, CIE
coordinate, CCT, EQE, CRI
Luminance
& color meter
Manufacturer
Konica minolta (CS-100A)
Specification
- Measuring range : 0.01 ~ 299,000 cd/m²
- Accuracy
· Luminance (Y) ± 2%
· Chromaticity (x, y) ± 0.004
Spectroradiometer
Manufacturer
Konica minolta (CS-2000)
Specification
-Measuring wavelength range : 380 ~ 780 nm
- Luminance measurement range
0.0125 ~ 125,000 cd/m²
- Accuracy
· Luminance (Y) ± 2%
· Chromaticity (x, y) ± 0.015
Manufacturer
Photal Otsuka electronics (LE-5400)
Specification
- The spectrophotometric method
based on the integrating
- Measurement wavelength range
300 ~ 800 nm
- Accuracy : ± 0.3 nm
Manufacturer
S-fac (OLA300)
Specification
- Control method : Constant current
- One module output
2 pins (signal, ground) / 4 points
- Voltage measurement range
- 10 V ~ + 10 V (resolution 1 mV)
- Current measurement range
- 10 mA ~ 10 mA (resolution 1 uA)
- 28 samples can be measured
simultaneously
- Sample size
· 25 × 25 mm² (bottom emission)
· 50 × 50 mm² (top emission)
- Atmosphere : Room temperature
(25 ˚C)
Manufacturer
McScience (K3000 LAB)
Specification
- K101 LAB50 Solar simulator (with K401 CW150 Lamp Power Supply)
· 1.2 sun intensity, 50 x 50 mm², Class AAA
- K101 LAB20 Photovoltaic Power meter(SMU)
· CC/CV pulse (± 10 V, ± 1 A)
- Containing measurement software
Manufacturer
JEIO Tech (TH-I)
Specification
- Temperature range (˚C) : -40 ~ 150
- Humidity range (%RH) : 20 ~ 98)
Manufacturer
Jasco (V-750)
Specification
- Light source : Halogen lamp,
Deuterium lamp
- Wavelength range : 190- 900 nm
- Data intervals : 0.1, 0.2, 0.5, 1, 2,
5, 10 nm
- Wavelength accuracy
± 0.2 nm (at 656.1 nm)
- Scanning speed
10~4000 nm/min
(8000 nm/min in preview mode)
- Sample type : Solution / Thin film
Manufacturer
Jasco (FP-8500)
Specification
- Light source
Continuous output Xe arc lamp with
shielded lamp housing (150 W)
- Wavelength range
Zero order, 200 - 850 nm
- Data intervals
1, 2.5, 5, 10, 20, L5, L10 nm
- Wavelength accuracy : ±1.0 nm
- Scanning speed
110, 20, 50, 100, 200, 500, 1,000,
2,000, 5,000, 10,000, 20,000,
60,000 nm/min
- Sample type : Solution (Cuvette)
Manufacturer
Hamamatsu (C11367)
Specification
- Light source : 60 W Xenon lamp
- Wavelength Range : 200 ~ 900 nm
- Wavelength resolution : 1 nm
- Wavelength accuracy : ± 1.5 nm
- Wavelength scan speed
~ 3,000 nm/min
- Sample type
· Solution, thin film
· Low temp. PL (solution)
Manufacturer
Bio Logic (SP-50)
Specification
- Current ranging : 10 μA to 800 mA
- Current resolution : 760 pA
- Control voltage : ±10 V
- Compliance : ±10 V
- Voltage resolution : 5 μV
- Acquisition time : 20 μs
- Control software : EC-Lab®
& EC-Lab® Express
Manufacturer
HORIBA (JOBIN YVON)
Specification
- UVISEL Specifications
· Spectral range : from 190 to 920 nm │NIR extension option up to 2100 nm
· Detection : High resolution monochromator coupled to sensitive detectors
- Integrated Goniometer
· Manual angle of incidence : 35° to 90° by 5° step
· Sample holder : 150mm, 20mm manual z height adjustment
· Autocollimation system for sample alignment in option
· Dimension : width: 25cm; height: 35cm; depth: 21 cm
- Performance
· Accuracy : Ψ= 45°±0.01° and Δ=0°±0.01°
measured in straight-through air configuration1.5 – 5.3 eV
· Repeatability : NIST 1000 Å SiO2/Si (190-2100 nm) : d ± 0.1 % – n(632.8nm)
± 0.0001
Manufacturer
KLA Tencor (D-500)
Specification
- Highest vertical range at 1200 μm
- Low force measurements at 0.03 to
15 mg
- Step height repeatability of 5 Å on a
1 μm step
- High resolution 5 MP color camera
with 4x digital zoom
Facilities
- Rotary 2EA
- Water purification system 1EA
- Reactor 5EA
